Non-contact confocal color sensor for semiconductor and electronics measurements

Quality officer

Non-contact confocal color sensor for semiconductor and electronics measurements

The MPLS sensor is fast and accurate, suitable for inline control requirements

Published: Tuesday 10 May 2022 – 12:00

(Marposs: Auburn Hills, MI) – Marposs, a world leader in measurement, inspection and test technologies, has announced the availability of its high performance STIL MPLS-DM sensor, the newest member of its Chromaline sensor family. This non-contact sensor enables fast, high-resolution measurement of distance, roughness, thickness and shape of all materials, including clear and polished mirror surfaces such as glass, plastic or silicon wafers, as well as liquids such as paint film.

The new MPLS-DM provides high quality control and working frequencies up to 2 kHz in standard mode or up to 6 kHz with a reduced sensor range. It is offered in five different models with 180 measuring points aligned along a line ranging from 1 mm to 12 mm and a minimum measurable thickness capability of 18 µm to 300 µm, depending on the model. All units measure 448.9mm x 184mm x 497mm (17.6 ” x 7.24 ” x 19.56 ”).

The MPLS-DM synchronizes the measurement using an encoder for dynamic acquisitions via Ethernet, with the availability of SDK and protocol commands for easy integration into any system. Based on STIL Chromatic Confocal technology, the MPLS sensor is extremely fast and accurate, making it suitable for inline control requirements.

The main confocal

Confocal color measurement technology divides white light into different spectra using objectives focused on an object through a multi-lens optical system. The lenses create and send a chromatically aberrated beam to the target. The target reflects the optical beam to the probe, where it transmits the reflected optical beam to a spectrometer. The reflected optical beam is composed of rays coming from the external surface of the object to be measured and from the internal surfaces that the beam is able to reach.

The intensity of the reflected light is maximum for the wavelengths focused on the surfaces. Electronic processing can then determine the intrastrate thickness values ​​of the target, or the distance from the probe to the outer surface and intrastrate surfaces of the target.

For more information on the MPLS-DM sensor, visit the Contactless Measurement with Chroma Sensor page (marposs.com)
Complete information on Marposs solutions is available at www.marposs.com, by calling (248) 370–0404 or by emailing marposs@us.marposs.com.

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The non-contact sensor STIL MPLS-DM from Marposs allows a fast and high resolution measurement of distance, roughness, thickness and shape of all materials.

About Marposs

Marposs, founded in 1952, has distinguished itself for providing advanced solutions that improve quality and productivity while reducing production costs through technologies such as process control, machine tool monitoring and precision measurement, as well as testing of sealing and automated assembly and control lines. A long-standing key supplier to the automotive and aerospace markets, Marposs’s growth strategy includes the acquisition of high-quality companies that offer innovative products complementary to their portfolio, enabling penetration into new market sectors. The group currently has more than 3,700 employees worldwide and is present in 25 countries through more than 80 offices.

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